A Gage Block Measurement Process Using Single Wavelength Interferometry, Issues 152-155 |
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Temperature . 4.2 . Atmospheric Pressure 4.3 . Water Vapor . . 5. Gage Block Measurement Procedure . 6. Computation of Gagę Block Length . 6.1 . Calculation of Wavelength . 6.2 . Calculation of the Whole Number of Fringes 6.3 .
Temperature . 4.2 . Atmospheric Pressure 4.3 . Water Vapor . . 5. Gage Block Measurement Procedure . 6. Computation of Gagę Block Length . 6.1 . Calculation of Wavelength . 6.2 . Calculation of the Whole Number of Fringes 6.3 .
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The blocks are wrung to a platen and mounted in an interferometer maintained in a temperature controlled environment . The fringe pattern is photographed and at the same moment those ambient conditions are measured which influence block ...
The blocks are wrung to a platen and mounted in an interferometer maintained in a temperature controlled environment . The fringe pattern is photographed and at the same moment those ambient conditions are measured which influence block ...
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Temperature stability of the interferometer and especially of the gage block being measured is important to precise measurement . For this reason an insulated housing encloses the entire interferometer to reduce the effects of normal ...
Temperature stability of the interferometer and especially of the gage block being measured is important to precise measurement . For this reason an insulated housing encloses the entire interferometer to reduce the effects of normal ...
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ENVIRONMENTAL CONDITIONS AND THEIR MEASUREMENT Environmental control of the laboratory holds temperature at 20 ° + .05 ° C and water vapor content below 50 % relative humidity . Temperature variations within the interferometer housing ...
ENVIRONMENTAL CONDITIONS AND THEIR MEASUREMENT Environmental control of the laboratory holds temperature at 20 ° + .05 ° C and water vapor content below 50 % relative humidity . Temperature variations within the interferometer housing ...
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Temperature measuring system schematic . thermal emfs generated by the temperature differences between measuring junction and reference junction are indicated on a nanovoltmeter . The nanovoltmeter is shared with the bridge where it is ...
Temperature measuring system schematic . thermal emfs generated by the temperature differences between measuring junction and reference junction are indicated on a nanovoltmeter . The nanovoltmeter is shared with the bridge where it is ...
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Bibliographic information
| Title | A Gage Block Measurement Process Using Single Wavelength Interferometry, Issues 152-155 A Gage Block Measurement Process Using Single Wavelength Interferometry, John S. Beers Volume 152 of NBS monograph |
| Author | John S. Beers |
| Publisher | U.S. Department of Commerce, National Bureau of Standards, 1975 |
| Original from | the University of Michigan |
| Digitized | 21 Nov 2007 |
| Length | 30 pages |
| Export Citation | BiBTeX EndNote RefMan |