X-ray Wavelength Conversion Tables and Graphs for Qualitative Electron Probe Microanalysis, Issues 406-415U.S. Department of Commerce, National Bureau of Standards, 1967 - 53 pages |
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6j coefficients analysis ANGULAR MOMENTUM COUPLING Angular Sensitivity ANPAK averaging device averaging sphere bits Bureau of Standards calculations coating code-word compression Cubic decision situations decision-making detector diffuse DOUBLE PRECISION EDDT ADP effect ellipsoidal mirror reflectometer emittance energy engineering entrance port equation error example Figure focal plane FORMAT Fortran Fortran II frequency incident flux infrared interferometer laboratory LB2 LIF LG1 LIF LIF EDDT ADP materials mathematical maximum microns MTRIA National Bureau NBS TECHNICAL NOTE NMAX NUPAK operator optical outcomes percent Phys possible pressure transducers procedure quantitative methods radius range ratio reference reflected flux sample second focal point Sensitivity Test shield signal solid angle spectral specular component sphere wall static calibration storage stored string subroutine sulfur superconductive Table temperature time-sharing U.S. DEPARTMENT uncertainty values variables virial coefficient wave function wavelength WRITE OUTPUT TAPE Z-ELEMENT LINE CRYSTAL zero
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