Remote Sensing and GIS for Site Characterization: Applications and Standards

Front Cover
Vernon Singhroy, Douglas Daniel Nebert, Arnold Ivan Johnson
ASTM, 1996 - 177 pages
Contains selected papers from the title international symposium, held in January 1994 in San Francisco, CA. Sections on remote sensing applications, geographic information system (GIS), site characterization, and standards detail the latest findings in areas such as digital elevation data; Landsat T

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Remote Sensing and GIS for Site Characterization: Applications and Standards
Vernon Singhroy,Douglas Daniel Nebert,Arnold Ivan Johnson
Limited preview - 1996

Bibliographic information

TitleRemote Sensing and GIS for Site Characterization: Applications and Standards
ASTM STP 1279
Volume 1279 of ASTM special technical publication, ISSN 0066-0558
Volume 1279 of ASTM special technical publication: American Society for Testing and Materials
Volume 1279 of American Society for Testing and Materials: ASTM special technical publication
Journal of ASTM International: Selected technical papers
Online access: ASTM International ASTM Standards and Engineering Digital Library
Volume 1279 of STP / ASTM
EditorsVernon Singhroy, Douglas Daniel Nebert, Arnold Ivan Johnson
Editionillustrated
PublisherASTM, 1996
ISBN0803120273, 9780803120273
Length177 pages
  
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