NBS Special Publication, Issues 400-411U.S. Government Printing Office, 1975 |
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Page 3
... shown in figure 1 , A is the depletion width on the heavily - doped side of the junction , B is the depletion width on the lightly - doped side of the junction , N ( A ) and N ( B ) are the respective net dopant densities at distances A ...
... shown in figure 1 , A is the depletion width on the heavily - doped side of the junction , B is the depletion width on the lightly - doped side of the junction , N ( A ) and N ( B ) are the respective net dopant densities at distances A ...
Page 11
... shown in figure 5. There are six possible ways in which the data point may appear in the plot . = ( 1 ) If Y2 < 3 , the data point is off scale at the low end ( dopant density too small ) ; this is represented by the symbol < to the ...
... shown in figure 5. There are six possible ways in which the data point may appear in the plot . = ( 1 ) If Y2 < 3 , the data point is off scale at the low end ( dopant density too small ) ; this is represented by the symbol < to the ...
Page 25
... given in [ 10 ] is shown below . The calculation , which occupies three pages in this report , consists of four parts ... shown in figure 5. In the third part , following LIST NBVSB , the values of N ( B ) in ( centimetres ) -3 and B in ...
... given in [ 10 ] is shown below . The calculation , which occupies three pages in this report , consists of four parts ... shown in figure 5. In the third part , following LIST NBVSB , the values of N ( B ) in ( centimetres ) -3 and B in ...
Page 6
... shown in fig- ure 1. The critical aspect of the design and fabrication is the achievement of a liquid - tight seal around the area to be an- odized . In the apparatus shown the seal is made by pressing the specimen against a TFE ...
... shown in fig- ure 1. The critical aspect of the design and fabrication is the achievement of a liquid - tight seal around the area to be an- odized . In the apparatus shown the seal is made by pressing the specimen against a TFE ...
Page 8
... figure for two typical cooli rates . Nevertheless , electrons occupy only a very small fraction of the defects and ... shown by the upper curves in and = 5.82 × 106T2exp ( -6847 / T ) , respectively , where T is the absolute tem- perature in ...
... figure for two typical cooli rates . Nevertheless , electrons occupy only a very small fraction of the defects and ... shown by the upper curves in and = 5.82 × 106T2exp ( -6847 / T ) , respectively , where T is the absolute tem- perature in ...
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Common terms and phrases
aluminum analysis angle applied beam energy bond pairs bond pull test boron Bureau of Standards calibration capacitance Center collector curve Darlington pairs depletion detector determined diffusion diode dopant density edge electrical electron beam emitter epitaxial eyepiece frequency function germanium heating image intensity profile impurity input integrated circuits intermediate-frequency ionization junction temperature Laboratory leak loop height materials measured pull strength method microscope mixer modulation MOS capacitor n-type National Bureau NBS Spec noise noise figure obtained operating output oxide p-n junction parameters percent PHOTOLITHOGRAPHY photomask plotted power transistors probe Publ ratio region resistance measurements resistor scanning electron scanning electron microscope Semiconductor Measurement Technology sheet resistance shown in figure silicon dioxide specimen spreading resistance substrate surface switching technical technique test patterns test structures thermal resistance thickness tion two-level bond values voltage wafer width wire bonds
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Page 22 - NATIONAL BUREAU OF STANDARDS The National Bureau of Standards' was established by an act of Congress March 3, 1901. The Bureau's overall goal is to strengthen and advance the Nation's science and technology and facilitate their effective application for public benefit. To this end. the Bureau conducts research and provides...
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