NBS Special Publication, Issues 400-411U.S. Government Printing Office, 1975 |
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Page 1
... included . Key Words : BASIC ; capacitance - voltage measurements ; computer programs ; dopant profiles ; error function ; Gaussian diffusion ; plotting , computer ; semi- conductors ; silicon . 1 . INTRODUCTION The capacitance ...
... included . Key Words : BASIC ; capacitance - voltage measurements ; computer programs ; dopant profiles ; error function ; Gaussian diffusion ; plotting , computer ; semi- conductors ; silicon . 1 . INTRODUCTION The capacitance ...
Page 15
... included in the program which calls INERF . In all such subprograms , an END statement must be included as the last statement . 4.3 . Rectangular Diodes In some applications it may be desirable or necessary to measure dopant density ...
... included in the program which calls INERF . In all such subprograms , an END statement must be included as the last statement . 4.3 . Rectangular Diodes In some applications it may be desirable or necessary to measure dopant density ...
Page 35
... included . Output for 17. KEY WORDS ( six to twelve entries ; alphabetical order ; capitalize only the first letter of the first key word unless a proper name ; separated by semicolons ) BASIC ; capacitance - voltage measurements ...
... included . Output for 17. KEY WORDS ( six to twelve entries ; alphabetical order ; capitalize only the first letter of the first key word unless a proper name ; separated by semicolons ) BASIC ; capacitance - voltage measurements ...
Page 1
... included as appendices . Key Words : Acoustic emission ; beam - lead bonds ; boron redistribution ; Darlington pairs ; dopant profiles ; electrical properties ; electronics ; epitaxial layer thickness ; flying- spot scanner ; gold ...
... included as appendices . Key Words : Acoustic emission ; beam - lead bonds ; boron redistribution ; Darlington pairs ; dopant profiles ; electrical properties ; electronics ; epitaxial layer thickness ; flying- spot scanner ; gold ...
Page 25
... and M. G. Buehler ) The factor F is not explicitly included in reference [ 35 ] but is implicit in the derivation . Naval Electronics Laboratory Center , San Diego , California 92152 . 7.1 . Cleave - and - Stain Measurements An attempt 25.
... and M. G. Buehler ) The factor F is not explicitly included in reference [ 35 ] but is implicit in the derivation . Naval Electronics Laboratory Center , San Diego , California 92152 . 7.1 . Cleave - and - Stain Measurements An attempt 25.
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Common terms and phrases
aluminum analysis angle applied beam energy bond pairs bond pull test boron Bureau of Standards calibration capacitance Center collector curve Darlington pairs depletion detector determined diffusion diode dopant density edge electrical electron beam emitter epitaxial eyepiece frequency function germanium heating image intensity profile impurity input integrated circuits intermediate-frequency ionization junction temperature Laboratory leak loop height materials measured pull strength method microscope mixer modulation MOS capacitor n-type National Bureau NBS Spec noise noise figure obtained operating output oxide p-n junction parameters percent PHOTOLITHOGRAPHY photomask plotted power transistors probe Publ ratio region resistance measurements resistor scanning electron scanning electron microscope Semiconductor Measurement Technology sheet resistance shown in figure silicon dioxide specimen spreading resistance substrate surface switching technical technique test patterns test structures thermal resistance thickness tion two-level bond values voltage wafer width wire bonds
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Page 53 - A special series of interim or final reports on work performed by NBS for outside sponsors (both government and non-government). In general, initial distribution is handled by the sponsor; public distribution is by the National Technical Information Services (Springfield, Va.
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Page 42 - ... materials needed by industry, commerce, educational institutions, and Government; provides advisory and research services to other Government Agencies; develops, produces, and distributes Standard Reference Materials; and provides calibration services.
Page 22 - NATIONAL BUREAU OF STANDARDS The National Bureau of Standards' was established by an act of Congress March 3, 1901. The Bureau's overall goal is to strengthen and advance the Nation's science and technology and facilitate their effective application for public benefit. To this end. the Bureau conducts research and provides...
Page 24 - THE INSTITUTE FOR BASIC STANDARDS provides the central basis within the United States of a complete and consistent system of physical measurement; coordinates that system with measurement systems of other nations; and furnishes essential services leading to accurate and uniform physical measurements throughout the Nation's scientific community, industry, and commerce.