NBS Special Publication, Issues 400-411U.S. Government Printing Office, 1975 |
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Page v
... Electron- ic Technology Division at the National Bureau of Standards . The Semiconductor Technology Program serves to focus NBS efforts to enhance the performance , interchangeability , and re- liability of discrete semiconductor ...
... Electron- ic Technology Division at the National Bureau of Standards . The Semiconductor Technology Program serves to focus NBS efforts to enhance the performance , interchangeability , and re- liability of discrete semiconductor ...
Page 44
... Electron density on gold acceptors in the space - charge region of a silicon pn junction Schematic representation of ... electron emission angle . Ratios of the relative areas of the x - ray photoelectron peaks due to carbon and silicon ...
... Electron density on gold acceptors in the space - charge region of a silicon pn junction Schematic representation of ... electron emission angle . Ratios of the relative areas of the x - ray photoelectron peaks due to carbon and silicon ...
Page vi
... electron de- vices for use in military systems . There is considerable overlap between the interests of DNA and ARPA . Measurement oriented ac- tivity appropriate to the mission of NBS is a critical element in the achievement of the ...
... electron de- vices for use in military systems . There is considerable overlap between the interests of DNA and ARPA . Measurement oriented ac- tivity appropriate to the mission of NBS is a critical element in the achievement of the ...
Page 1
... electron probe , mathematical modeling of ultrasonic bonding , an improved method for force adjustment and measurement on beam - lead bonders , helium mass spectrometry for leak testing , thermal resistance measurements on Darlington ...
... electron probe , mathematical modeling of ultrasonic bonding , an improved method for force adjustment and measurement on beam - lead bonders , helium mass spectrometry for leak testing , thermal resistance measurements on Darlington ...
Page 3
... electron , ion , and photon beam measurement technologies for determina- tion of impurities in silicon and silicon dioxide . In these preliminary measurements , ion implanted specimens are being used to provide a reasonably well known ...
... electron , ion , and photon beam measurement technologies for determina- tion of impurities in silicon and silicon dioxide . In these preliminary measurements , ion implanted specimens are being used to provide a reasonably well known ...
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Common terms and phrases
aluminum analysis angle applied beam energy bond pairs bond pull test boron Bureau of Standards calibration capacitance Center collector curve Darlington pairs depletion detector determined diffusion diode dopant density edge electrical electron beam emitter epitaxial eyepiece frequency function germanium heating image intensity profile impurity input integrated circuits intermediate-frequency ionization junction temperature Laboratory leak loop height materials measured pull strength method microscope mixer modulation MOS capacitor n-type National Bureau NBS Spec noise noise figure obtained operating output oxide p-n junction parameters percent PHOTOLITHOGRAPHY photomask plotted power transistors probe Publ ratio region resistance measurements resistor scanning electron scanning electron microscope Semiconductor Measurement Technology sheet resistance shown in figure silicon dioxide specimen spreading resistance substrate surface switching technical technique test patterns test structures thermal resistance thickness tion two-level bond values voltage wafer width wire bonds
Popular passages
Page 53 - A special series of interim or final reports on work performed by NBS for outside sponsors (both government and non-government). In general, initial distribution is handled by the sponsor; public distribution is by the National Technical Information Services (Springfield, Va.
Page 19 - Handbooks — Recommended codes of engineering and industrial practice (including safety codes) developed in cooperation with interested industries, professional organizations, and regulatory bodies. Special Publications...
Page ii - In no case does such identification imply recommendation or endorsement by the National Bureau of Standards, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
Page 42 - ... materials needed by industry, commerce, educational institutions, and Government; provides advisory and research services to other Government Agencies; develops, produces, and distributes Standard Reference Materials; and provides calibration services.
Page 22 - NATIONAL BUREAU OF STANDARDS The National Bureau of Standards' was established by an act of Congress March 3, 1901. The Bureau's overall goal is to strengthen and advance the Nation's science and technology and facilitate their effective application for public benefit. To this end. the Bureau conducts research and provides...
Page 24 - THE INSTITUTE FOR BASIC STANDARDS provides the central basis within the United States of a complete and consistent system of physical measurement; coordinates that system with measurement systems of other nations; and furnishes essential services leading to accurate and uniform physical measurements throughout the Nation's scientific community, industry, and commerce.