NBS Special Publication, Issues 400-411U.S. Government Printing Office, 1975 |
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... A BASIC Program for Calculating Dopant Density Profiles from Capacitance - Voltage Data UNIVERSITY OF MICHIGAN LIBRARIES JUN 12 1975 DEPOSITED BY THE UNITED STATES OF AMERICA NATIONAL BUREAU OF STANDARDS The National Bureau of Standards ...
... A BASIC Program for Calculating Dopant Density Profiles from Capacitance - Voltage Data UNIVERSITY OF MICHIGAN LIBRARIES JUN 12 1975 DEPOSITED BY THE UNITED STATES OF AMERICA NATIONAL BUREAU OF STANDARDS The National Bureau of Standards ...
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... Washington , D.C. 20234 . Part of the Center for Radiation Research Located at Boulder , Colorado 80302 . Part of the Center for Building Technology . Semiconductor Measurement Technology : A BASIC Program for Calculating Dopant.
... Washington , D.C. 20234 . Part of the Center for Radiation Research Located at Boulder , Colorado 80302 . Part of the Center for Building Technology . Semiconductor Measurement Technology : A BASIC Program for Calculating Dopant.
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... A BASIC Program for Calculating Dopant Density Profiles from Capacitance - Voltage Data UNIVERSITY OF MICHIGAN LIBRARIES JUN 12 1975 DEPOSITED BY THE UNITED STATES OF AMERICA NATIONAL BUREAU OF STANDARDS The National Bureau of Standards '
... A BASIC Program for Calculating Dopant Density Profiles from Capacitance - Voltage Data UNIVERSITY OF MICHIGAN LIBRARIES JUN 12 1975 DEPOSITED BY THE UNITED STATES OF AMERICA NATIONAL BUREAU OF STANDARDS The National Bureau of Standards '
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Semiconductor Measurement Technology : A BASIC Program for Calculating Dopant Density Profiles from Capacitance - Voltage Data Richard L. Mattis and Martin G. Buehler Electronic Technology Division Institute for Applied Technology ...
Semiconductor Measurement Technology : A BASIC Program for Calculating Dopant Density Profiles from Capacitance - Voltage Data Richard L. Mattis and Martin G. Buehler Electronic Technology Division Institute for Applied Technology ...
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... Dopant Density Profiles from Capacitance - Voltage Data . ( Semiconductor Measurement Technology ) ( National Bureau of Standards Special Publication ; 400-11 ) Supt . of Docs . No .: C 13.10 : 400-11 1. Electronic Data Processing - Ion ...
... Dopant Density Profiles from Capacitance - Voltage Data . ( Semiconductor Measurement Technology ) ( National Bureau of Standards Special Publication ; 400-11 ) Supt . of Docs . No .: C 13.10 : 400-11 1. Electronic Data Processing - Ion ...
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Common terms and phrases
aluminum analysis angle applied beam energy bond pairs bond pull test boron Bureau of Standards calibration capacitance Center collector curve Darlington pairs depletion detector determined diffusion diode dopant density edge electrical electron beam emitter epitaxial eyepiece frequency function germanium heating image intensity profile impurity input integrated circuits intermediate-frequency ionization junction temperature Laboratory leak loop height materials measured pull strength method microscope mixer modulation MOS capacitor n-type National Bureau NBS Spec noise noise figure obtained operating output oxide p-n junction parameters percent PHOTOLITHOGRAPHY photomask plotted power transistors probe Publ ratio region resistance measurements resistor scanning electron scanning electron microscope Semiconductor Measurement Technology sheet resistance shown in figure silicon dioxide specimen spreading resistance substrate surface switching technical technique test patterns test structures thermal resistance thickness tion two-level bond values voltage wafer width wire bonds
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Page 53 - A special series of interim or final reports on work performed by NBS for outside sponsors (both government and non-government). In general, initial distribution is handled by the sponsor; public distribution is by the National Technical Information Services (Springfield, Va.
Page 19 - Handbooks — Recommended codes of engineering and industrial practice (including safety codes) developed in cooperation with interested industries, professional organizations, and regulatory bodies. Special Publications...
Page ii - In no case does such identification imply recommendation or endorsement by the National Bureau of Standards, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
Page 42 - ... materials needed by industry, commerce, educational institutions, and Government; provides advisory and research services to other Government Agencies; develops, produces, and distributes Standard Reference Materials; and provides calibration services.
Page 22 - NATIONAL BUREAU OF STANDARDS The National Bureau of Standards' was established by an act of Congress March 3, 1901. The Bureau's overall goal is to strengthen and advance the Nation's science and technology and facilitate their effective application for public benefit. To this end. the Bureau conducts research and provides...
Page 24 - THE INSTITUTE FOR BASIC STANDARDS provides the central basis within the United States of a complete and consistent system of physical measurement; coordinates that system with measurement systems of other nations; and furnishes essential services leading to accurate and uniform physical measurements throughout the Nation's scientific community, industry, and commerce.