NBS Special Publication, Issues 400-411U.S. Government Printing Office, 1975 |
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Page 44
... Detection Thermal Properties of Devices .. Thermal Resistance Methods Darlington Pairs 1. Transient Thermal Response • · · • · Semiconductor Technology Program Staff` . Semiconductor Technology Program Publications Workshop and ...
... Detection Thermal Properties of Devices .. Thermal Resistance Methods Darlington Pairs 1. Transient Thermal Response • · · • · Semiconductor Technology Program Staff` . Semiconductor Technology Program Publications Workshop and ...
Page 18
... detection limit ca be enhanced by prolonging the measurement interval . ( A. G. Lieberma + Rutherford Backscattering Spectrometry . Electron Spectroscopy for Chemical Analysis . 6. TEST PATTERNS TEST PATTERNS 10 2 3 29 30 18.
... detection limit ca be enhanced by prolonging the measurement interval . ( A. G. Lieberma + Rutherford Backscattering Spectrometry . Electron Spectroscopy for Chemical Analysis . 6. TEST PATTERNS TEST PATTERNS 10 2 3 29 30 18.
Page 32
... DETECTOR LOW NOISE PREAMPLIFIER AMPLIFIER AND A TO D CONVERTER DIGITAL COUNTER RECORDER Figure 24. Block diagram of ... Detection Anomalous 32.
... DETECTOR LOW NOISE PREAMPLIFIER AMPLIFIER AND A TO D CONVERTER DIGITAL COUNTER RECORDER Figure 24. Block diagram of ... Detection Anomalous 32.
Page 33
... Detection Anomalous results were obtained from the second stage of the interlaboratory evalua- tion of the helium mass spectrometer method [ 42 ] for testing fine capillary leaks in large volume ( ~ 1.5 cm3 ) containers being conducted ...
... Detection Anomalous results were obtained from the second stage of the interlaboratory evalua- tion of the helium mass spectrometer method [ 42 ] for testing fine capillary leaks in large volume ( ~ 1.5 cm3 ) containers being conducted ...
Page 34
... detector . The e : - fect of outgassing was then limited to the wall area around the capillary leak ; only one - sixteenth to one - tenth of the total va area was exposed to the detector . From the data of figure 25b it is possible to ...
... detector . The e : - fect of outgassing was then limited to the wall area around the capillary leak ; only one - sixteenth to one - tenth of the total va area was exposed to the detector . From the data of figure 25b it is possible to ...
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Common terms and phrases
aluminum analysis angle applied beam energy bond pairs bond pull test boron Bureau of Standards calibration capacitance Center collector curve Darlington pairs depletion detector determined diffusion diode dopant density edge electrical electron beam emitter epitaxial eyepiece frequency function germanium heating image intensity profile impurity input integrated circuits intermediate-frequency ionization junction temperature Laboratory leak loop height materials measured pull strength method microscope mixer modulation MOS capacitor n-type National Bureau NBS Spec noise noise figure obtained operating output oxide p-n junction parameters percent PHOTOLITHOGRAPHY photomask plotted power transistors probe Publ ratio region resistance measurements resistor scanning electron scanning electron microscope Semiconductor Measurement Technology sheet resistance shown in figure silicon dioxide specimen spreading resistance substrate surface switching technical technique test patterns test structures thermal resistance thickness tion two-level bond values voltage wafer width wire bonds
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Page 53 - A special series of interim or final reports on work performed by NBS for outside sponsors (both government and non-government). In general, initial distribution is handled by the sponsor; public distribution is by the National Technical Information Services (Springfield, Va.
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Page 22 - NATIONAL BUREAU OF STANDARDS The National Bureau of Standards' was established by an act of Congress March 3, 1901. The Bureau's overall goal is to strengthen and advance the Nation's science and technology and facilitate their effective application for public benefit. To this end. the Bureau conducts research and provides...
Page 24 - THE INSTITUTE FOR BASIC STANDARDS provides the central basis within the United States of a complete and consistent system of physical measurement; coordinates that system with measurement systems of other nations; and furnishes essential services leading to accurate and uniform physical measurements throughout the Nation's scientific community, industry, and commerce.