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" Rademacher, G Reim, P Seyfried, and H Siegert , "Absolute measurement of the (220) lattice plane spacing in a silicon crystal", Phys. "
NIST Special Publication - Page 197
1988
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R ntgen Centennial: X-rays in Natural and Life Sciences

A. Haase, Gottfried Landwehr, Eberhard Umbach - 1997 - 726 pages
...Dorenwendt, G. Ebeling, L. Lauer, W. Lucas, R. Probst, H.-J. Rademacher, G. Reim, P. Seyfried, and H. Siegert, Absolute Measurement of the (220) Lattice...Plane Spacing in a Silicon Crystal, Phys. Rev. Lett. 23, 1540-1543 (1981). 14. P. Seyfried and P Becker, The role of JVA in the SI: An Atomic Path to the...
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A Century of Excellence in Measurements, Standards, and Technology

David R. Lide - 2001 - 402 pages
...Becker, The silicon lattice parameter — an invariant quantity of nature?, Metrologia 35, 811-817(1998). [7] Peter Becker, Klaus Dorenwendt, Gerhard Ebeling....Lattice Period, IEEE Trans. Instrum. Meas. IM-36, 166169 (1987). [9] RD Deslattes, A. Henins, HA Bowman. RM Schoonover, CL Carroll, IL Barnes. LA Machlan....
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X-Ray Optics: High-Energy-Resolution Applications

Yuri Shvyd'ko - 2004 - 424 pages
...Probst, R., Radermacher, H.-J., Reim, G., Seyfried, P. and Siegert, H.: 1981, Absolute measurements of the (220) lattice plane spacing in a silicon crystal, Phys. Rev. Lett. 46, 1540. Bergamin. A., Cavagnero, G., Mana, G. and Zosi, G.: 1999, Scanning xray interferometry and the...
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