NBS Special Publication, Issues 400-431U.S. Government Printing Office, 1977 |
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Page 1
... production and product control , with cost savings through early detection of production line defects and rapid corrective action . Key words : Corona charging decoration ; dielectric defect detection ; electrophoretic decoration ...
... production and product control , with cost savings through early detection of production line defects and rapid corrective action . Key words : Corona charging decoration ; dielectric defect detection ; electrophoretic decoration ...
Page 4
... production line , the new test methods are a valuable tool for assessing developmental studies for improving ... production and product control , in terms of both cost savings due to early detection of production line defects and rapid ...
... production line , the new test methods are a valuable tool for assessing developmental studies for improving ... production and product control , in terms of both cost savings due to early detection of production line defects and rapid ...
Page 9
... produce readily visible vortices above the defects [ 8,16 ] ; formation of trains of hydrogen gas bubbles rising from ... production control ; ( 4 ) slow and not suitable for automation ; ( 5 ) subjective , because read - out by operator ...
... produce readily visible vortices above the defects [ 8,16 ] ; formation of trains of hydrogen gas bubbles rising from ... production control ; ( 4 ) slow and not suitable for automation ; ( 5 ) subjective , because read - out by operator ...
Page 69
... produce the suspension . The concentrate and dilute suspension are stable for long periods ( months ) . The carbon black in this suspension is negatively charged so that positive corona potentials are used for reverse decoration . The ...
... produce the suspension . The concentrate and dilute suspension are stable for long periods ( months ) . The carbon black in this suspension is negatively charged so that positive corona potentials are used for reverse decoration . The ...
Page 77
... production facility to rank wafer quality and set a quality acceptance criterion . Initially , photomicrographs were made of carbon black reverse- decorated devices on IC wafers . Transparencies made from these micro- graphs were then ...
... production facility to rank wafer quality and set a quality acceptance criterion . Initially , photomicrographs were made of carbon black reverse- decorated devices on IC wafers . Transparencies made from these micro- graphs were then ...
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Common terms and phrases
Acrylic aluminum etching aluminum-metallized applications Base Sheet Resistor BEC Model bias voltage Bias-Isolation Unit brightfield Bureau of Standards C-meter capacitance capacitor Capacitor over Collector carbon black circuit cm³ computed corona charging cracks defect detection demarcation etching demarcation-etched deposition dielectric screening length diode dopant density e-e scattering effect electron mobility EMITTER etch time factor etchant film Greek Cross impurity scattering mobility integrated circuits ionized impurity scattering liquid Lubrizol mask for quadrant materials metal microcracks microscope MOS Capacitor n-type silicon National Bureau neutral impurity scattering Number Oxide surface voltage p-n junctions partial pinholes passivation layer phonon phosphor phosphorus-doped silicon photomicrographs Photoresist Program quadrant are listed Resistor Greek Cross reverse decoration S(Cs sample Semiconductor Semiconductor Measurement Technology sensitivity Sheet Resistor Greek shown in figure silicon dioxide silicon nitride suspension technical techniques test pattern NBS-4 theoretical thermal thickness total donor density wafer
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Page 2 - Bureau conducts research and provides: (1) a basis for the Nation's physical measurement system, (2) scientific and technological services for industry and government, (3) a technical basis for equity in trade, and (4) technical services to promote public safety.
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Page 2 - Standards, the Institute for Materials Research, the Institute for Applied Technology, the Institute for Computer Sciences and Technology, and the Office for Information Programs. THE INSTITUTE FOR BASIC STANDARDS provides the central basis within the United States of a complete and consistent system of physical measurement; coordinates that system with measurement systems of other nations; and furnishes essential services leading to accurate and uniform physical measurements throughout the Nation's...
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Page 85 - ... Recommended codes of engineering and industrial practice (including safety codes) developed in cooperation with interested industries, professional organizations, and regulatory bodies. Special Publications.
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Page 85 - Comprehensive scientific papers give complete details of the work, including laboratory data, experimental procedures, and theoretical and mathematical analyses. Illustrated with photographs, drawings, and charts.
Page 2 - Technology. THE OFFICE FOR INFORMATION PROGRAMS promotes optimum dissemination and accessibility of scientific information generated within NBS and other agencies of the Federal Government; promotes the development of the National Standard Reference Data System and a system of information analysis centers dealing with the broader aspects of the National Measurement System; provides appropriate services to ensure that the NBS staff has optimum accessibility to the scientific information of the world,...